IP Probes: Test Probe B

Jointed test finger

Description

This is the “International”test finger required by
most IEC, EN and CSA Standards, in addition to
many UL Standards. Built in strict accordance to
the newest requirements with integral palm simulator. This is the ONLY Finger Probe available
with a integral jack in the handle for continuity
testing – as mandated by the IEC CB Scheme. The
handle is made of plastic and the finger is made of
chrome plated steel. All parts precision machined.

Technical specifications
IP Probes: Test Probe B
Reference standard
Applications
Knurled finger diameter 12mm
Knurled finger length 80mm
Baffle plate diameter 50mm
Baffle plate length 100mm
Baffle thickness 20mm
Material plastic + stainless steel

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